Semiconductor Test Equipment

Open-Short Tester (iOST)

Open-Short Tester (iOST)
At a glance

Up to 16,384 channels of fast, accurate and intelligent open/short testing for maximum efficiency and quality in semiconductor packaging.

Compared with conventional open/short test equipment, iOST is designed to be faster, more accurate and smarter to use — delivering the highest efficiency and quality in semiconductor package testing.

High pin count

Up to 16,384 channels. Thanks to a real-time multiplexing design, even a 16,384-channel system has 50% lower latency than the previous 2,048-channel generation. Each chassis supports up to 2,048 channels (16 CH boards × 128 channels), and LB cables remain fully compatible with the previous system.

High performance

  • High precision — every circuit uses new-generation industrial-grade components (OPA, PGA, ADC, DAC…) for better accuracy, higher speed and lower temperature drift.
  • High reliability — built-in precision voltage references and smart self-calibration circuitry. A low-power design with fully isolated measurement units keeps data stable even in noisy environments, and one-key self-calibration replaces tedious manual calibration so testing is always correct.
  • High speed — iOST keeps the traditional instrument command interface but adds an on-board test program processor that runs all measurements autonomously while the PC analyses results in parallel. Dedicated real-time channel switching keeps signal delay minimal, so even 16,384 channels have very limited impact on OST test time.

iOST system

Intelligent features

  • Auto-learning — simple parameter setup and enhanced algorithms produce more accurate analysis and more complete test conditions, so production can start immediately. Existing test programs remain compatible. Per-channel voltage, current and impedance statistics, together with I-V and V-T curve analysis, help engineers validate and debug test programs faster.
  • Full self-diagnostics — the HP16 series includes a dedicated Diag-Board with high-precision, low-drift circuitry for accurate DUT simulation and standard load testing, plus APMU force/measure verification, LB cable impedance checks, CH board leakage checks and diode curve tests to resolve issues quickly during mass production.
  • Precision self-calibration — stable references and smart calibration with no trimmer adjustment reduce the effects of temperature, humidity and vibration. The RWC (Read-Write-Click) procedure is simple: connect a certified precision DMM, read the voltage, write it into the software console and click Calibrate — done automatically within 10 seconds.
  • Yield analysis — use the built-in V / I / R tools for static per-channel testing, or dynamic I-V and V-T curves for failure analysis. Yield and fault statistics are presented as tables and charts so process issues surface quickly.

Specifications

System
Performance
PC Interface1-Port USB
Max. Pin-Count16384 (128CH~16384CH)
Test Time
(8192-pin System)
0.4mS Per Pin Typically
(Test Current = 100uA, CV = 3.0V)
A/D, D/A Resolution16-bit
Handler Interface1. Support Maximum 16-Site HIF (*1)
2. SOT, EOT, BIN1/BIN2/BIN3, RET Handshaking (*2)
3. TTL/CMOS, 3.3~15V, with Optical Isolator
Operation1. 4-quadrant operation: Pin-to-Pin, Pin-to-All, All-to-Pin
2. Force Current Measure Voltage (FIMV), with Voltage Clamping
3. Force Voltage Measure Current (FVMI), with Current Clamping
4. Leakage Current Measurement
5. I-V Curve and V-T Curve analysis
6. Kelvin 4-wire Architecture
APMU
Resolution
Accuracy (*3)
Force Voltage±10.0V0.313mV± 0.3%
Force Current± 10.0uA0.156nA± 0.4%
± 0.1mA1.562nA± 0.2%
± 1.0mA15.62nA± 0.2%
± 10.0mA156.2nA± 0.2%
Measure Voltage± 1.0V0.032mV± 0.1% ± 1.0mV
± 2.0V0.063mV± 0.1% ± 1.0mV
± 4.0V0.125mV± 0.1% ± 2.0mV
± 8.0V0.250mV± 0.1% ± 4.0mV
Measure Current± 10.0uA0.313nA± 0.2% ± 0.01uA
± 100.0uA3.125nA± 0.1% ± 0.10uA
± 1.0mA31.25nA± 0.1% ± 1.00uA
± 10.0mA312.5nA± 0.1% ± 10.0uA
Measure Leakage (*4)10~200nA0.078nA± 1.0% ± 0.5nA
0.2-3.0uA0.156nA± 0.5% ± 5.0nA
Software
Application
OSWindows XP/XP Pro, Windows 7/8/10 or higher version
Operation1. Production/Engineer mode controlled by Password
2. Smart Program Auto-Learning/Program Editor
3. Real-Time Production Status Monitoring
4. Manual Pin-Testing/Analysis, Production Statistics Logger/Analysis
5. One-Key Self-Calibration/Fully Self-Diagnostics
File I/O1. Text Engineering Statistics file
2. Text Production Logger/Fault Analysis file
3. Text Wire definition/Test Program file
4. Text System Configuration file
*1: Standard equipped 2-Site/8-Site HIF. 16-Site HIF is optional, TBD
*2: RET function of HIF is optional, TBD
*3: Accuracy ± (% of Display ± Offset), 1 Year, 23℃ ± 5℃
*4: Guaranteed by parametric design, not subject to production test

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