In development since 2004, our Open-Short Tester brings fast, accurate and intelligent testing to semiconductor packaging.
Up to 16,384 channels with real-time multiplexing, 50% lower latency than the previous generation and compatibility with existing test programs.
2,048 channels per chassis and up to 16,384 per system, with compatible LB cables.
New-generation industrial components for higher accuracy, speed and lower drift.
Fully isolated measurement units deliver stable data in noisy environments.
Auto-learning, self-diagnostics and yield statistics to resolve issues fast.
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